Micro 3 Point Bend Fixture. Rated capacity: 1 kN
2810-411 | Micro 3 Point Bend Fixture
Adjustable Span: 3 mm to 10 mm.
Capacity 1 kN (225 lb, 100 kgf).
Temperature range: -75°C to 300°C (-103°F to 572°F). Maximum specimen width: 20 mm (0.79 in).
Anvil size; 0.25 mm radius
Upper and lower fittings: Type Om (12 mm connection with 6 mm clevis pin).
This micro bend fixture is designed for three point flexure testing of miniature components and specimens, where the specimen is supported on two lower anvils and load is applied by a single upper anvil at the center of the specimen.
The upper anvil is designed with a precisely machined edges, which assists in setting the lower anvils to the required span, ensuring that specimen loading will take place at the exact center of the span and thus preventing errors caused by misalignment between the upper and lower anvils.
Note: 3110-718 Pullrod required for 334X and 594X single column test systems.
|アンビル径||Upper/Lower = 0.5 mm in )|
|荷重容量||1 kN (225 lbf )|
|下側取り付け||6mm clevis pin (Type Om)|
|試験片幅||0 - 20 mm (0 - 0.79 in )|
|支持スパン||3 - 10 mm (0.12 - 0.4 in )|
|温度速度||-75 +300 °C (-103°F to 572°F °F )|
|上側取り付け||6mm clevis pin (Type Om)|
Bend or flexure testing provides a convenient method for characterizing the strength of the miniature components and specimens typical of those found in microelectronics applications.
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