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Micro Three-Point Bend Testing for Microelectronics

Reliability analysis of electronic packages and components is a critical step in microelectronics, as these packages are widely used in portable devices such as smartphones, tablets, laptops, etc. Studying electrical performance may not be enough, as a package’s mechanical characterization can directly or indirectly impact reliability of a finished product. Three-point bend tests are performed to understand the strength of chip packages, such as chip-on-film (COF), integrated circuits (IC), and ball grid arrays (BGAs).

Posted By Rajiv Iyer OnApr 03, 2017 03:33 PM

Own Your Data and Results: Export Files, Import to LIMS

Accurate and repeatable test results are the most important product of a mechanical test. Properly managing these test results can be more challenging than conducting the test itself. Although there are several common data management and results reporting practices throughout the testing industry, most labs take approaches that are unique to them. In order to make it easier for all labs to take control of their test results and data, we have introduced several new exporting features with the release of Bluehill® Universal.

Posted By Jeffrey Shaffer OnMar 30, 2017 01:36 PM

How Important is Calibrating Materials Testing Systems?

There are many different reasons why you should calibrate your testing system. Primarily, calibration is performed to ensure that your testing system is operating within its requirements. Whether these requirements are established by law, government regulation, industry regulation, or your own company quality system, organizations have recognized the importance of calibrating systems at regular intervals.

Posted On Mar 23, 2017 09:04 AM

Traceability: What is it, and Why is it Important?

Let’s begin with a definition from The International Vocabulary of Metrology (VIM): Metrological Traceability is the property of a measurement result whereby the result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty.

Posted On Feb 12, 2017 04:14 PM

Growth of ITW Young Professionals Network in Europe

Instron Applications Engineers Maeve Higham and Alessandro Zazzarelli sat down for an interview to share their great work for Europe’s Young Professionals Network. This newly established cohort is gathering across Europe and supporting the rising talent of Illinois Tool Works (ITW), Instron’s parent company.

Posted On Dec 08, 2016 10:14 AM

Today’s Biomaterials Testing and Characterization

Instron Biomedical Market Manager Elayne Gordonov recently reviewed the state of biomaterials testing and characterization with Advanced Materials & Processes (AM&P) Magazine.

Posted On Dec 04, 2016 02:13 PM