BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Instron - ECPv6.18.0//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Instron
X-ORIGINAL-URL:https://www.instron.jp/ja/
X-WR-CALDESC:Instron のイベント
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20250309T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20251102T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20260308T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20261101T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20270314T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20271107T060000
END:STANDARD
END:VTIMEZONE
BEGIN:VTIMEZONE
TZID:Europe/London
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20250330T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20251026T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20260329T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20261025T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20270328T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20271031T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260929T080000
DTEND;TZID=America/New_York:20260929T163000
DTSTAMP:20260616T192631Z
CREATED:20260518T173844Z
LAST-MODIFIED:20260616T192631Z
UID:10000179-1790668800-1790699400@www.instron.jp
SUMMARY:静的材料試験入門
DESCRIPTION:In this one-day course\, students will learn about materials testing. The course highlights the basics of materials testing including mechanical properties\, different types of testing\, stress/strain test curves\, modulus\, yield\, and application testing with demonstrations on computerized materials test instruments. Students will observe tensile\, compressive\, flexural\, and peel tests to learn to interpret test curves and calculated results. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUnderstand basic materials testing terminology\, theory and concepts\nUnderstand typical force/displacement test curves and be able to distinguish between different types of curves\nDo’s and Dont’s when running typical tensile\, compression\, flexure\, and peel tests\nLearn good testing procedures when using a computerized testing instrument to perform tension\, compression\, flexural and peel testing\nLearn the importance of system calibration for data accuracy\nUnderstand specimen geometry and the importance of specimen dimensions\nCalculate stress\, strain\, elongation\, modulus\, offset yield\, and other advanced calculations\nBe able to interpret test curves and to label major points and results\nUnderstand different types of strain measurements and devices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/introduction-to-static-materials-testing-09-29-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/classroom-with-projector.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20260929T090000
DTEND;TZID=Europe/London:20260929T163000
DTSTAMP:20260616T192934Z
CREATED:20260515T133049Z
LAST-MODIFIED:20260616T192934Z
UID:10000218-1790672400-1790699400@www.instron.jp
SUMMARY:Bluehill® Universal 試験方法開発入門
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nBook This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-introduction-to-test-method-development-09-29-2026/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/high-wycombe-classroom-with-instructor.jpg
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
END:VEVENT
END:VCALENDAR