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DTSTART;TZID=America/Los_Angeles:20260918T083000
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DTSTAMP:20260616T201217Z
CREATED:20260515T133044Z
LAST-MODIFIED:20260616T201217Z
UID:10000483-1789720200-1789747200@www.instron.jp
SUMMARY:Bluehill® Universal TestProfiler メソッド開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-09-18-2026/
LOCATION:カリフォルニア州アーバイン\, アーバイン\, CA\, United States
CATEGORIES:トレーニング
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260921T090000
DTEND;TZID=America/New_York:20260921T163000
DTSTAMP:20260617T121235Z
CREATED:20260513T193314Z
LAST-MODIFIED:20260617T121235Z
UID:10000620-1789981200-1790008200@www.instron.jp
SUMMARY:静的材料試験入門
DESCRIPTION:In this one-day course\, students will learn about materials testing. The course highlights the basics of materials testing including mechanical properties\, different types of testing\, stress/strain test curves\, modulus\, yield\, and application testing with demonstrations on computerized materials test instruments. Students will observe tensile\, compressive\, flexural\, and peel tests to learn to interpret test curves and calculated results. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUnderstand basic materials testing terminology\, theory and concepts\nUnderstand typical force/displacement test curves and be able to distinguish between different types of curves\nDo’s and Dont’s when running typical tensile\, compression\, flexure\, and peel tests\nLearn good testing procedures when using a computerized testing instrument to perform tension\, compression\, flexural and peel testing\nLearn the importance of system calibration for data accuracy\nUnderstand specimen geometry and the importance of specimen dimensions\nCalculate stress\, strain\, elongation\, modulus\, offset yield\, and other advanced calculations\nBe able to interpret test curves and to label major points and results\nUnderstand different types of strain measurements and devices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/introduction-to-static-materials-testing-8/
LOCATION:バーチャル
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2020/10/free-training-homepage-news.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260922T090000
DTEND;TZID=America/New_York:20260922T163000
DTSTAMP:20260616T194313Z
CREATED:20260515T133046Z
LAST-MODIFIED:20260616T194313Z
UID:10000311-1790067600-1790094600@www.instron.jp
SUMMARY:Bluehill® Universal 試験方法開発入門
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-introduction-to-test-method-development-09-22-2026/
LOCATION:バーチャル
CATEGORIES:トレーニング
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260923T090000
DTEND;TZID=America/New_York:20260923T163000
DTSTAMP:20260617T120915Z
CREATED:20260514T192457Z
LAST-MODIFIED:20260617T120915Z
UID:10000581-1790154000-1790181000@www.instron.jp
SUMMARY:Bluehill® Universal 高度な試験方法開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore advanced tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of advanced Test Method development and administrative controls. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUtilize the Expression Builder function through the method development process\nUnderstand calculation and graphical domains\nUnderstand virtual measurements utilization\nSetup custom transducers\nUnderstand the features on Instron Connect\nSetup software Security and login settings\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-advanced-test-method-development-09-23-2026/
LOCATION:バーチャル
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2024/12/hwservicetraining-400x250-1.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260924T090000
DTEND;TZID=America/New_York:20260924T163000
DTSTAMP:20260616T194206Z
CREATED:20260515T133048Z
LAST-MODIFIED:20260616T194206Z
UID:10000303-1790240400-1790267400@www.instron.jp
SUMMARY:Bluehill® Universal TestProfiler メソッド開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-09-24-2026/
LOCATION:バーチャル
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2020/10/free-training-homepage-news.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260929T080000
DTEND;TZID=America/New_York:20260929T163000
DTSTAMP:20260616T192631Z
CREATED:20260518T173844Z
LAST-MODIFIED:20260616T192631Z
UID:10000179-1790668800-1790699400@www.instron.jp
SUMMARY:静的材料試験入門
DESCRIPTION:In this one-day course\, students will learn about materials testing. The course highlights the basics of materials testing including mechanical properties\, different types of testing\, stress/strain test curves\, modulus\, yield\, and application testing with demonstrations on computerized materials test instruments. Students will observe tensile\, compressive\, flexural\, and peel tests to learn to interpret test curves and calculated results. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUnderstand basic materials testing terminology\, theory and concepts\nUnderstand typical force/displacement test curves and be able to distinguish between different types of curves\nDo’s and Dont’s when running typical tensile\, compression\, flexure\, and peel tests\nLearn good testing procedures when using a computerized testing instrument to perform tension\, compression\, flexural and peel testing\nLearn the importance of system calibration for data accuracy\nUnderstand specimen geometry and the importance of specimen dimensions\nCalculate stress\, strain\, elongation\, modulus\, offset yield\, and other advanced calculations\nBe able to interpret test curves and to label major points and results\nUnderstand different types of strain measurements and devices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/introduction-to-static-materials-testing-09-29-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/classroom-with-projector.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20260929T090000
DTEND;TZID=Europe/London:20260929T163000
DTSTAMP:20260616T192934Z
CREATED:20260515T133049Z
LAST-MODIFIED:20260616T192934Z
UID:10000218-1790672400-1790699400@www.instron.jp
SUMMARY:Bluehill® Universal 試験方法開発入門
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nBook This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-introduction-to-test-method-development-09-29-2026/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/high-wycombe-classroom-with-instructor.jpg
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260930T080000
DTEND;TZID=America/New_York:20260930T163000
DTSTAMP:20260616T193901Z
CREATED:20260515T135730Z
LAST-MODIFIED:20260616T193901Z
UID:10000277-1790755200-1790785800@www.instron.jp
SUMMARY:Bluehill® Universal 試験方法開発入門
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-introduction-to-test-method-development-09-30-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/student-with-instructor-norwood-classroom.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
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END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20260930T090000
DTEND;TZID=Europe/London:20260930T163000
DTSTAMP:20260617T120635Z
CREATED:20260514T192458Z
LAST-MODIFIED:20260617T120635Z
UID:10000542-1790758800-1790785800@www.instron.jp
SUMMARY:Bluehill® Universal 高度な試験方法開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore advanced tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of advanced Test Method development and administrative controls. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUtilize the Expression Builder function through the method development process\nUnderstand calculation and graphical domains\nUnderstand virtual measurements utilization\nSetup custom transducers\nUnderstand the features on Instron Connect\nSetup software Security and login settings\n\nBook This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-advanced-test-method-development-09-30-2026/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/classroom-with-projector.jpg
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261001T080000
DTEND;TZID=America/New_York:20261001T163000
DTSTAMP:20260616T193756Z
CREATED:20260515T135732Z
LAST-MODIFIED:20260616T193756Z
UID:10000268-1790841600-1790872200@www.instron.jp
SUMMARY:Bluehill® Universal 高度試験方法開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore advanced tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of advanced Test Method development and administrative controls. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUtilize the Expression Builder function through the method development process\nUnderstand calculation and graphical domains\nUnderstand virtual measurements utilization\nSetup custom transducers\nUnderstand the features on Instron Connect\nSetup software Security and login settings\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-advanced-test-method-development-10-01-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2025/10/Training_Stock_1.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261001T090000
DTEND;TZID=America/New_York:20261001T163000
DTSTAMP:20260616T192847Z
CREATED:20260515T135733Z
LAST-MODIFIED:20260616T192847Z
UID:10000208-1790845200-1790872200@www.instron.jp
SUMMARY:Bluehill® Universal TestProfiler メソッド開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nBook This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-10-01-2026/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/student-holding-dogbone-with-course-materials.jpg
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261001T110000
DTEND;TZID=America/New_York:20261001T120000
DTSTAMP:20260716T141040Z
CREATED:20260615T132408Z
LAST-MODIFIED:20260716T141040Z
UID:10000414-1790852400-1790856000@www.instron.jp
SUMMARY:バイタルサイン：医療機器を支えるプラスチックの評価
DESCRIPTION:材料試験は、バイオメディカル分野のパッケージ、コンポーネント、およびデバイスのアセンブリに使用されるプラスチックが、その意図された用途に適していることを証明する上で極めて重要な役割を果たします。本セッションでは、バイオメディカル業界特有の材料試験の側面、特に規制環境下でのコンプライアンスを遵守した試験をサポートするために必要なプロセス、管理、および文書化の実務に焦点を当てます。  \n学習内容\n • バイオメディカル用途で一般的に見られる使い捨てパッケージ、コンポーネント、コネクタへの材料試験の適用方法\n • 従来の試験アプローチが直接適用できない可能性がある、複雑なデバイスやアセンブリを試験する際の実用的な考慮事項\n • FDA規制環境に沿った適切な文書化、バリデーション戦略、および試験実務を通じてコンプライアンスを維持する方法 \n対象者\n規制下にあるバイオメディカルまたは医療機器環境において、材料試験を担当するバイオメディカルエンジニア、品質・薬事専門家、デバイスメーカー、およびラボチーム。 \nインストロンが選ばれる理由\nインストロンは、プラスチック試験に関する深い専門知識と、バイオメディカルラボをサポートしてきた豊富な経験を兼ね備えています。本セッションでは、一貫性の向上、オペレーターに起因するばらつきの低減、および試験プロセスの強化により、コンプライアンスを遵守し、十分に文書化された材料試験ワークフローをサポートするための実用的なガイダンスを共有します。  \n今すぐ登録
URL:https://www.instron.jp/ja/event/vital-signs-evaluating-the-plastics-behind-medical-devices/
LOCATION:バーチャル
CATEGORIES:ウェビナー
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/06/plastics-in-medical-devices-webinar.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261002T080000
DTEND;TZID=America/New_York:20261002T163000
DTSTAMP:20260616T201126Z
CREATED:20260515T135735Z
LAST-MODIFIED:20260616T201126Z
UID:10000468-1790928000-1790958600@www.instron.jp
SUMMARY:Bluehill® Universal TestProfiler メソッド開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-10-02-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/high-wycombe-classroom-with-instructor.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20261002T090000
DTEND;TZID=Europe/London:20261002T163000
DTSTAMP:20260616T201038Z
CREATED:20260515T135740Z
LAST-MODIFIED:20260616T201038Z
UID:10000467-1790931600-1790958600@www.instron.jp
SUMMARY:信頼性の高いテストの秘訣
DESCRIPTION:How to avoid common mistakes \nEven the most experienced operators make mistakes. Knowing what those mistakes are — and how to avoid them — can save significant time\, cost\, and frustration. In the materials testing world\, one important question that needs to be asked is: \n“Are you getting inconsistent results even though you are using the same method\, testing machine\, operator\, or material?” \nAfter being contacted for assistance by many customers\, Instron developed the Secrets of Reliable Testing course to address the most common causes of inconsistent results in materials testing. Download the course outline to see the full program. \nFrequently Asked Questions \n\nWho is it for? Machine operators\, lab managers\, quality managers\, and research and development and product development teams.\nIs prior knowledge of materials testing required? Yes\, a basic level of knowledge on using testing machines is recommended.\nHow many people can attend? A maximum of 12 attendees per course.\nDuration: One day.\nLocation: This course is available throughout Europe and can take place at your facility or a local Instron office. Classroom training dates are also available at Instron’s European headquarters in High Wycombe\, UK.\n\nBook This Course
URL:https://www.instron.jp/ja/event/secrets-of-reliable-testing-10-02-2026/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
CATEGORIES:トレーニング
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
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DTSTART;TZID=America/New_York:20261013T110000
DTEND;TZID=America/New_York:20261013T120000
DTSTAMP:20260817T184340Z
CREATED:20260817T184340Z
LAST-MODIFIED:20260817T184340Z
UID:10001032-1791889200-1791892800@www.instron.jp
SUMMARY:同一の複合材料を6通りで試験した際に、7つの試験所が明らかにしたこと
DESCRIPTION:試験所がASTMおよびISO規格を厳密に遵守していても、一方向炭素繊維複合材料の引張試験結果はばらつくことがあります。そして、その理由は必ずしも想像どおりとは限りません。7つの試験所と6種類の試験片（クーポン）形状を対象とした最近の国際ラウンドロビン試験では、ばらつきの真の要因を特定することを目的とし、その結果は試験片形状、ひずみゲージの精度、試料準備に関する従来の前提の一部に疑問を投げかけています。本ウェビナーでは、Instronが本研究の主要な知見と、それが皆様の試験実務にとって何を意味するのか、さらに適切なツールと手法によって各試験からより一貫性が高く信頼できるデータを得る方法をご紹介します。 \nアジェンダ \n\n研究の概要—7つの試験所と6種類の試験片（クーポン）形状を用いて、複合材料の引張試験におけるばらつきを本当に左右する要因を特定した方法\n結果の不一致を招く真の要因—試験片形状や実施試験所よりも、試料準備と切断方法が重要である理由\nひずみ測定を再考—従来のひずみゲージに対して、光学式伸び計およびDICについてデータが示すこと\nクリーンな破断の検証—高速撮影により破壊位置を確認した方法と、それが結果の解釈に与える意味\n実務への適用—一方向引張試験でより信頼性の高いデータを得るために、これらの知見の活用を支援するInstronの製品・サービス\n\n今すぐ登録
URL:https://www.instron.jp/ja/event/what-seven-labs-discovered-when-they-tested-the-same-composite-six-ways/
LOCATION:バーチャル
CATEGORIES:ウェビナー
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/08/high-energy-composites-specimen-failure-tensile-testing.jpg
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END:VCALENDAR