BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Instron - ECPv6.18.0//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Instron
X-ORIGINAL-URL:https://www.instron.jp/ja/
X-WR-CALDESC:Instron のイベント
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:America/New_York
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20250309T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20251102T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20260308T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20261101T060000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:-0500
TZOFFSETTO:-0400
TZNAME:EDT
DTSTART:20270314T070000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:-0400
TZOFFSETTO:-0500
TZNAME:EST
DTSTART:20271107T060000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261117T080000
DTEND;TZID=America/New_York:20261117T163000
DTSTAMP:20260616T200947Z
CREATED:20260515T135743Z
LAST-MODIFIED:20260616T200947Z
UID:10000462-1794902400-1794933000@www.instron.jp
SUMMARY:静的材料試験入門
DESCRIPTION:In this one-day course\, students will learn about materials testing. The course highlights the basics of materials testing including mechanical properties\, different types of testing\, stress/strain test curves\, modulus\, yield\, and application testing with demonstrations on computerized materials test instruments. Students will observe tensile\, compressive\, flexural\, and peel tests to learn to interpret test curves and calculated results. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUnderstand basic materials testing terminology\, theory and concepts\nUnderstand typical force/displacement test curves and be able to distinguish between different types of curves\nDo’s and Dont’s when running typical tensile\, compression\, flexure\, and peel tests\nLearn good testing procedures when using a computerized testing instrument to perform tension\, compression\, flexural and peel testing\nLearn the importance of system calibration for data accuracy\nUnderstand specimen geometry and the importance of specimen dimensions\nCalculate stress\, strain\, elongation\, modulus\, offset yield\, and other advanced calculations\nBe able to interpret test curves and to label major points and results\nUnderstand different types of strain measurements and devices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/introduction-to-static-materials-testing-11-17-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261117T110000
DTEND;TZID=America/New_York:20261117T120000
DTSTAMP:20261014T115127Z
CREATED:20260615T142312Z
LAST-MODIFIED:20261014T115127Z
UID:10000380-1794913200-1794916800@www.instron.jp
SUMMARY:繰り返しの自動化：自動化がプラスチック試験をどのように最適化するか
DESCRIPTION:自動化は、プラスチック試験ラボにおける一貫性、処理能力、およびオペレーターに依存しない試験結果の向上に大きな変革をもたらしています。自動化には大規模で完全なロボットシステムが必要だと思われがちですが、実際にはシンプルなワークフローの改善から完全に統合された試験セルまで、幅広いソリューションが存在します。本セッションでは、再現性の強化、日常業務の効率化、そして必要に応じた真の無人試験（ライツアウト・テスティング）をサポートするための、自動化の具体的な活用方法を探ります。   \n本コースで習得できる内容\n • 自動化による再現性と精度の向上（特に大量のQCワークフローにおいて）\n • 処理能力の向上とボトルネックの解消により、厳しい生産スケジュールに対応する方法\n • 夜間や24時間体制でラボを稼働させるための「無人試験」戦略 \n受講対象者\n大量のQC試験を行うラボ、材料サプライヤー、自動車・電子機器メーカー、および自動機械試験の導入を検討されている方。 \nインストロンが選ばれる理由\nロボットによる試験片ハンドリングから完全に統合された試験セルまで、インストロンは世界中のラボにおいて品質を損なうことなく能力を拡張するお手伝いをしてきました。本セッションでは、その知見を詳しくご紹介します。 \n今すぐ登録する
URL:https://www.instron.jp/ja/event/putting-it-on-repeat-how-automation-optimizes-plastics-testing/
LOCATION:バーチャル
CATEGORIES:ウェビナー
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/06/automation-in-plastics-testing-webinar.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261118T080000
DTEND;TZID=America/New_York:20261118T163000
DTSTAMP:20260616T200909Z
CREATED:20260515T135745Z
LAST-MODIFIED:20260616T200909Z
UID:10000449-1794988800-1795019400@www.instron.jp
SUMMARY:Bluehill® Universal 試験メソッド開発入門
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-introduction-to-test-method-development-11-18-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/high-wycombe-classroom-with-instructor.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261119T080000
DTEND;TZID=America/New_York:20261119T163000
DTSTAMP:20260616T200724Z
CREATED:20260515T135746Z
LAST-MODIFIED:20260616T200724Z
UID:10000430-1795075200-1795105800@www.instron.jp
SUMMARY:Bluehill® Universal 高度な試験方法開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore advanced tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of advanced Test Method development and administrative controls. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUtilize the Expression Builder function through the method development process\nUnderstand calculation and graphical domains\nUnderstand virtual measurements utilization\nSetup custom transducers\nUnderstand the features on Instron Connect\nSetup software Security and login settings\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-advanced-test-method-development-11-19-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/student-with-instructor-norwood-classroom.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20261120T080000
DTEND;TZID=America/New_York:20261120T163000
DTSTAMP:20260616T200714Z
CREATED:20260515T135748Z
LAST-MODIFIED:20260616T200714Z
UID:10000431-1795161600-1795192200@www.instron.jp
SUMMARY:Bluehill® Universal TestProfiler法開発
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-11-20-2026/
LOCATION:インストロン本社\, 825 University Ave\, ノーウッド\, マサチューセッツ州\, 02062-2643\, United States
CATEGORIES:トレーニング
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2026/05/high-wycombe-classroom-with-instructor.jpg
ORGANIZER;CN="Instron %E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E5%8C%97%E7%B1%B3":MAILTO:training_center@instron.com
GEO:42.20390177;-71.17161315
X-APPLE-STRUCTURED-LOCATION;VALUE=URI;X-ADDRESS=インストロン本社 825 University Ave ノーウッド マサチューセッツ州 02062-2643 United States;X-APPLE-RADIUS=500;X-TITLE=825 University Ave:geo:-71.17161315,42.20390177
END:VEVENT
END:VCALENDAR