BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//Instron - ECPv6.18.2//NONSGML v1.0//EN
CALSCALE:GREGORIAN
METHOD:PUBLISH
X-WR-CALNAME:Instron
X-ORIGINAL-URL:https://www.instron.jp/ja/
X-WR-CALDESC:Instron のイベント
REFRESH-INTERVAL;VALUE=DURATION:PT1H
X-Robots-Tag:noindex
X-PUBLISHED-TTL:PT1H
BEGIN:VTIMEZONE
TZID:Europe/London
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20260329T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20261025T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20270328T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20271031T010000
END:STANDARD
BEGIN:DAYLIGHT
TZOFFSETFROM:+0000
TZOFFSETTO:+0100
TZNAME:BST
DTSTART:20280326T010000
END:DAYLIGHT
BEGIN:STANDARD
TZOFFSETFROM:+0100
TZOFFSETTO:+0000
TZNAME:GMT
DTSTART:20281029T010000
END:STANDARD
END:VTIMEZONE
BEGIN:VEVENT
DTSTART;TZID=Europe/London:20270211T090000
DTEND;TZID=Europe/London:20270211T163000
DTSTAMP:20261022T184238Z
CREATED:20261022T184238Z
LAST-MODIFIED:20261022T184238Z
UID:10001094-1802336400-1802363400@www.instron.jp
SUMMARY:Bluehill Universal TestProfiler Method Development
DESCRIPTION:In this one-day course\, students will work with a certified Instron® training instructor to explore the various tools and functions of the powerful Bluehill® Universal TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.jp/ja/event/bluehill-universal-testprofiler-method-development-9/
LOCATION:インストロン欧州本社\, コロネーション・ロード\, ハイ・ウィカム\, バッキンガムシャー\, HP12 3SY\, United Kingdom
ATTACH;FMTTYPE=image/jpeg:https://www.instron.jp/wp-content/uploads/2024/06/svc_training_2.jpg
ORGANIZER;CN="Instron%E3%83%88%E3%83%AC%E3%83%BC%E3%83%8B%E3%83%B3%E3%82%B0 - %E3%83%A8%E3%83%BC%E3%83%AD%E3%83%83%E3%83%91":MAILTO:traininguk@Instron.com
END:VEVENT
END:VCALENDAR